您的位置：Exhibition
| Exhibition Time | Countries and Regions of the Exhibition | Exhibition Preview | Booth Number | Exhibited Products |
| 2025.03.24-26 | Shanghai International Convention and Exhibition Center, China | Electronic Circuit & Electrical Component, PCB, FPC Exhibition | 8L71 | Instant Inspection Scanning Rapid Measuring Machine 3D Microscope Ion Contamination Tester |
| 2025.08.20-22 | BITEC Hall 99-100, Bangkok Exhibition Center, Thailand 2025 Asian Electronic Circuit Exhibition Thailand Station |
2025 Asian Electronic Circuit Exhibition Thailand (Thai Printed Circuit Association THPCA) | 5L84 | Ion Contamination Tester |
| 2025.12.03-05 | China Shenzhen International Electronic Circuit Exhibition | Exhibition Theme: PCB, FPC, Electronic Components Exhibition | To be determined | Instant Inspection Scanning Rapid Measuring Machine 3D Microscope CAF Insulation Resistance Test System |
| 2025.11.05-07 | Vietnam Industry and Manufacturing Exhibition / Bac Ninh | 2025 Vietnam Bac Ninh Electronic Manufacturing Exhibition | 280 | Image Measuring Instrument Instant Inspection Scanning Rapid Measuring Machine Ion Contamination Tester |
| Exhibition Time | Countries and Regions of the Exhibition | Exhibition Preview | Booth Number | Exhibited Products |
| 2026.3.24-26 | China Shanghai International Exhibition Center | Electronic Circuit, Electrical Components, PCB and FPC Exhibition | Tentative | Instant Scanning Rapid Measuring Machine 3D Microscope Ionic Contamination Tester |
| 2026.12.02-04 | China Shenzhen International Circuit Exhibition | Exhibition Theme: PCB, FPC & Electronic Components Exhibition | Tentative | Instant Scanning Rapid Measuring Machine 3D Microscope CAF Insulation Resistance Test System |
| 2026.10.27-29 | Semiconductor Packaging Technology Exhibition / NEPCON Asia | Exhibition Theme: PCB, FPC & Electronic Components Exhibition | Tentative | Instant Scanning Rapid Measuring Machine 3D Microscope Ionic Contamination Tester |
| 2026.9.10-12 | Xi’an Junke Exhibition Co., Ltd. | Electronic Information Equipment and Technology Exhibition | E10-4 | Instant Scanning Rapid Measuring Machine 3D Microscope Ionic Contamination Tester |
| 2026.6.17-19 | Vietnam | Vietnam (Southern) International Industrial Manufacturing and Automation Exhibition | Tentative | Automatic Vision Measuring Machine 3D Rotating Microscope |
