Ion Contamination Tester
上一个:AI Connector Terminal Size Defect Inspection Machine 下一个:3D Ultra-Deep Field Microscope
详情介绍

Product Introduction

Designed and manufactured in accordance with IPC-TM-650 standard (Test Method 2.3.25), the Ion Contamination Testing System measures the resistivity change of PCB, FPC, PACA and electronic components immersed in ultrapure solution by dynamic extraction method. The degree of resistivity change reflects the contamination level, which is usually caused by residues from manufacturing and assembly processes.

Product Advantages

1. Six series of Ion Contamination Testers are available with inner tank dimensions (length × width × thickness): 60×60×60mm, 250×200×60mm, 350×350×60mm, 350×650×60mm, 650×650×60mm, 800×800×60mm.
2. The software features integrated dynamic and static testing functions, effectively improving testing efficiency.
3. Equipped with Chinese/English display, metric/imperial unit conversion settings and calibration mode for simple and easy operation.
4. Conductivity resolution: 0.0005μS/cm², measurement range: 0-20μS/cm.
5. Measurement accuracy: ±3%, extractant specific gravity: 0.8-0.855.
6. Convenient and fast report output, displaying conductivity and contamination concentration curves.
7. Customization available: various inner cavity sizes and MES upload modes can be customized.
8. Independent intellectual property rights, including software copyrights and utility model patents.
 

Application Fields

Capacitors Resistors PCB Electronic Components Integrated Circuit (IC) Chips
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